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    Plant-to-Plant Uniformity is Essential for Optimum Yield in No-Till Continuous Corn

    Christopher Boomsma and, Tony Vyn (October, 2007)
    Summary

    This publication presents research that shows how plant height uniformity influences yield in continuous corn using conservation tillage systems. This publication discusses some real causes of yield loss in no-till corn after corn related to corn growth and development and provides remedies for alleviating them.

  • Details

    Organization
    Purdue Extension
    Publisher
    Purdue University
    Published
    October, 2007
    Material Type
    Written Material
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